CASPIAN JOURNAL
MANAGEMENT AND HIGH TECHNOLOGIES
Algorithm of effective impacts generation on the scheme for testing electronic means
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Read | Abrameshin Andrey Ye., Ivanov Ilya A., Kofanov Yuriy N., Sotnikova Svetlana Yu. Algorithm of effective impacts generation on the scheme for testing electronic means // Caspian journal : management and high technologies. — 2015. — №2. — pp. 172-182. |
Abrameshin Andrey Ye. - Ph.D. (Sociology), National Research University Higher School of Economics, 20 Myasnitskaya St., Moscow, 101000, Russian Federation, aabrameshin@hse.ru
Ivanov Ilya A. - Ph.D. (Engineering), National Research University Higher School of Economics, 20 Myasnitskaya St., Moscow, 101000, Russian Federation, ivanov_i_a@mail.ru
Kofanov Yuriy N. - D.Sc. (Engineering), Professor, National Research University Higher School of Economics, 20 Myasnitskaya St., Moscow, 101000, Russian Federation, yurykofanov@yandex.ru
Sotnikova Svetlana Yu. - Ph.D. (Engineering), National Research University Higher School of Economics, 20 Myasnitskaya St., Moscow, 101000, Russian Federation, sveta1708@mail.ru
The urgency of test generation problem is founded to increase the efficiency of monitoring and diagnosing electronic means. As part of the information system of diagnostic modeling implementation, the algorithm of test forming, that provides analysis of the circuitry in the static mode, as well as in the frequency and time domains, is considered. In the static mode operation is considered to explore the В«input/outputВ» characteristic, where there are different testing algorithms for linear and nonlinear plots. In frequency domain, according to the algorithm of test forming, the zeros and poles of transfer function are calculated. After that the most effective frequencies of test signals are chosen between zeros and poles. In dynamic domain, according to the appropriate algorithm, the operation form and operation characteristic of circuitry are chosen. Then permissible parameters of electronic components are analyzed. The selection method of effective test impact is proposed according to the uniqueness criterion of distinguishing detectable defects. The diagnostic modeling is carried out, wherein the output characteristics at the circuit output or at internal nodes are analyzed under the test impact and to the degree of defects differentiation within measurement error is determined.
Key words: тестирование, тестовое воздействие, электронное средство, генерация сигналов, эффективные сигналы, статический режим, частотная область, динамический режим, диагностирование, моделирование, дифференциация дефектов, testing, test action, electronic means,