CASPIAN JOURNAL
MANAGEMENT AND HIGH TECHNOLOGIES
Formal metrics for automated evaluation of an invention
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Read | Kravets A.G., Legenchenko M.S. Formal metrics for automated evaluation of an invention // Caspian journal : management and high technologies. — 2017. — №3. — pp. 8-19. |
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Kravets A.G. - Doct. Sci. (Engineering), Professor, Volgograd State Technical University, 28 Lenin Ave., Volgograd, 400005, Russian Federation, agk@gde.ru
Legenchenko M.S. - graduate student, Volgograd State Technical University, 28 Lenin Ave., Volgograd, 400005, Russian Federation, asassdas2@gmail.com
The objectives of the study described in this article are the development of a common concept and methods for formal assessment of the world prior-art state in a specific domain, taking into account its cross-thematic relations with other areas of knowledge and technologies; a research of the possibilities of using developed metrics in automated systems of patent search; an analysis of formal approaches to examining the invention which is the basis of filing the patent application.To achieve these goals, a number of scientific problems have been solved. A phenomenological study of some advanced technologies taking into account their cross-thematic relations was carried out;the general patterns and main stages of the lifecycle of technology wereestablished and theoretically justified. The main stages of the development of the lifecycle of technologywere theoretically substantiated. The time dependencies of evolution processes of some indicators are characterized. The relationships between the general indicators inherent in any technology are defined.New approaches to the identification of formal metrics for evaluating the invention based on information available in the patent application are proposed. These approaches allow us to predict some lifecycle processes of the invention and related technologies, as well as to accumulate experience in the form of new knowledge and dependencies in the prediction of the world prior-art state.
Key words: патентная экспертиза, формализация оценок, алгоритмы формализации, мировой технический уровень, промышленная применимость, потенциал модернизации, информационные технологии, поддержка принятия решений, метрики оценки, математические модели, patent examina